Comparison of the freeze-out in Indium and B doper n MOSFETs in the temperature range 4.2—300 K |
|
Charateristics of deep submicron n-MOSFETs in the temperature range 4.2--300 |
|
Hand-held operational demining system |
|
Modelling of the Backscatter Behaviour of Typical Antipersonnel Landmines by computer simulations |
|
Calculation of Fingerprints of Typical Antipersonnel Landmines by Varying the Observation Point and Incidence Angles of Excitations |
|
Comparison of the freeze-out in Indium and B doper n MOSFETs in the temperature range 4.2—300 K |
|
Extraction of Relative Permittivity from Measured Reflection Coefficient of Dielectric Materials in the Frequency Range 207 – 247 GHz |
|
Dielectric Material Characterization in the Frequency Range 68 - 92 GHz |
|
Dielectric Material Characterization in the Frequency Range 68 - 92 GHz |
|
Measuring the Permittivity of Dielectric Materials by Using 140 GHz FMCW Radar Sensor |
|
A Compact Measurement Setup for In-Situ Material Characterization in the Lower THz Range |
|