Charateristics of deep submicron n-MOSFETs in the temperature range 4.2--300

Authors:

I. Alawneh, E. Simoen, S. Biesemenms, K. De Meyer and C. Claeys

Conference:

Annual Belgian Society General Scientific Meeting

Location:

Faculaties Universität Notre-Dam de la Paix, Namur, Belgian

Date:

Wednesday, May 20, 1998

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